Characterization of Epitaxial Heavily Doped Silicon Regions Formed by Hot-Wire Chemical Vapor Deposition Using Micro-Raman and Microphotoluminescence Spectroscopy

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ژورنال

عنوان ژورنال: IEEE Journal of Photovoltaics

سال: 2018

ISSN: 2156-3381,2156-3403

DOI: 10.1109/jphotov.2018.2818284